SMART: Selective MAC zero-optimzation for neural network reliability under radiation

Anuj Justus Rajappa; Philippe Reiter; Tarso Kraemer Sarzi Sartori; Luiz Henrique Laurini; Hassen Fourati; Siegfried Mercelis; Peter Hellinckx; Rodrigo Possamai Bastos

Conference Papers Year : 2023

SMART: Selective MAC zero-optimzation for neural network reliability under radiation

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Anuj Justus Rajappa

Function : Author

Internet Technology and Data Science Lab

Philippe Reiter

Function : Author

Internet Technology and Data Science Lab

Tarso Kraemer Sarzi Sartori

Function : Author
PersonId : 1343638
IdRef : 275158284

Architectures and Methods for Resilient Systems

Dynamics and Control of Networks

Luiz Henrique Laurini

Function : Author

Architectures and Methods for Resilient Systems

Hassen Fourati

Function : Author
PersonId : 19087
IdHAL : hassen-fourati
ORCID : 0000-0002-8398-7183
IdRef : 149995695

Dynamics and Control of Networks

Siegfried Mercelis

Function : Author

Universiteit Antwerpen = University of Antwerpen [Antwerpen]

Peter Hellinckx

Function : Author

Universiteit Antwerpen = University of Antwerpen [Antwerpen]

Rodrigo Possamai Bastos

Function : Author
PersonId : 735900
IdHAL : rpbastos
ORCID : 0000-0002-9964-0424
IdRef : 147702321

Architectures and Methods for Resilient Systems

CV

Keywords

sparsity radiation MAC multiply-accumulate optimization sparsity radiation MAC multiply-accumulate optimization

Domains

Micro and nanotechnologies/Microelectronics

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ESREF2023_paper_175.pdf (150.76 Ko)

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Hassen Fourati : Connect in order to contact the contributor

https://hal.science/hal-04094354

Submitted on : Wednesday, May 10, 2023-11:16:07 PM

Last modification on : Thursday, April 4, 2024-6:27:14 PM

Long-term archiving on : Friday, August 11, 2023-7:52:09 PM

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hal-04094354 , version 1 (10-05-2023)

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HAL Id : hal-04094354 , version 1

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Anuj Justus Rajappa, Philippe Reiter, Tarso Kraemer Sarzi Sartori, Luiz Henrique Laurini, Hassen Fourati, et al.. SMART: Selective MAC zero-optimzation for neural network reliability under radiation. ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. pp.1-4. ⟨hal-04094354⟩

SMART: Selective MAC zero-optimzation for neural network reliability under radiation

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